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Jul 21, 2019


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Bradford G. Van Treuren

I don't see people talk about the non-intrusive aspects of JTAG that are important for NFF testing. SAMPLE is a powerful tool that can still be used for test analysis, albeit far limited to what can be done with EXTEST. One is able to detect changes on inputs to confirm an open is not existing, for example. Similar state capture of internal registers is extremely important and not impacting device operation. These could be left intact as partial fused configurations by fusing the select lines of other registers as a simple implementation.

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