Functional test used in manufacturing production has always been something of a challenge. Often it boils down to a make-versus-buy decision. If the tests are built in-house, there is always the pressure to get it done quicker, often due to the development schedule squeezing the production test development schedule into a shorter time window. Then development time becomes a major concern. If the test is bought, these are often generic tools that need environmental tweaking or limiting of the test robustness that was originally desired. There are simply too many tradeoffs.
ASSET joined the Open Compute Project (OCP) earlier this year, and we attended our first Engineering Workshop in Dallas last week. The theme of this session was the OCP Telco Project. What did we learn?
With the rapid pace of product development today, we are all tempted to take shortcuts to get the product to market sooner than our competition. One hopes that the shortcuts taken during manufacturing test do not result in a two-million-unit recall. Some of the shortcuts don’t seem obvious or deliberate.
ASSET’s Michael Johnson presented an update on Non-intrusive Board Test (NBT) at the 13th Annual Board Test Workshop (BTW) in Fort Collins, CO this past week. The overall question posed at the Workshop was, “Is Board Test Losing Relevance”?
The MSP430 is a mixed-signal microcontroller family from Texas Instruments. Built around a 16-bit CPU, the MSP430 is designed for low cost, low power consumption embedded applications. But, does it support boundary scan for board test purposes?
When an x86 system has crashed, gathering forensics data to help diagnose root-cause of the failure is a top priority. But, how is this done if the system has crashed, and OS/BIOS-based application programs cannot access the platform?