Is it possible to use JTAG at debug & repair depots to reduce the cost of diagnosing bad boards?
In recent years, the increasing size of flash memory has driven device programming to offline methods. However, new techniques are significantly reducing in-system programming times, making it much more feasible and convenient to program flash memory after it’s already been soldered to the board.
As network functions become virtualized and proprietary hardware migrates to commodity Intel-based servers, will Carrier service levels degrade?
Recently launched DDR4 devices have what memory device vendors may refer to as a “boundary scan” test mode. Even though there’s not really a boundary-scan function involved on the DDR4 side, this mode actually has been, as claimed by JEDEC, “designed to work seamlessly with any boundary-scan devices.” Here’s a brief introduction to what it does and how to test it with a boundary-scan (JTAG) tool.
As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.
Boundary-scan test is used commonly on manufacturing lines with a “benchtop” tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?
Software and hardware debug, validation and test of complex systems has always been a challenge that’s demanded innovative new solutions. Now, one of the biggest challenges facing our industry is the disappearing boundary between hardware and software when it comes to finding the root causes of problems. Solving those tough problems is what ASSET InterTech is about, no matter where the problem is.
Posted by Glenn Woppman on Jul 13, 2015 in Arium Probes | SourcePoint™, Boundary Scan, Embedded Diagnostics, FPGA-Controlled Test (FCT), High-Speed I/O, Industry Standards and Forums, Intel® IBIST, Non-intrusive Board Test (NBT), Processor-Controlled Test (PCT), Software Debug and Trace | Permalink | Comments (0)
You may have heard: if you fail to plan, you plan to fail. This was never truer than when you’re integrating an SoC and your IP blocks have embedded TAPs (eTAPs). Failing to consider how multiple eTAPs relate, block-to-block and top-to-bottom, leaves designers unable to tap into the embedded instruments for validation and debug. And, if you think this is bad, just wait until the test people on the production line start screaming at you!
Self-healing or self-defeating? That’s the question circuit board manufacturers have to ask about on-board interconnects like Intel® QuickPath Interconnect (QPI) and other such buses that tout their self-healing capabilities.
Some users may like this capability because it keeps their systems running, even if the speed of the system slows down. But board manufacturers who rely solely on functional test and/or probe-based test technologies like in-circuit test (ICT) to detect shorts and opens, and other structural faults are likely sacrificing product performance and manufacturing quality by neglecting to test with boundary-scan (JTAG).
It’s not every day that a prestigious market research firm like Frost & Sullivan recognizes a company for its customer-oriented business strategies. But that’s what happened today when F&S announced that ASSET had received one of its coveted Customer Value Leadership Awards in the Printed Circuit Board Design Validation and Test segment of the industry.
What earned SourcePoint and ScanWorks this recognition is the tremendous user value our tools offer in terms of the visibility they deliver to software and hardware engineers. Awards like this are certainly gratifying to us as a company, but on a personal level they remind us of the great gratitude we have for our customers. We could not have won this or any of our previous honors without their suggestions and influence, inputs that we rely on to drive our strategic decisions.