Test Data Out

Defects on High-Speed Memory – Part 2

Last month, we saw how defects on memory data lines can cause a system to fail, and yet escape detection by the system boot loader or BIOS. Let’s examine this in more technical detail.

Embedded Run-Control for Debug and Test

Embedded run-control (aka on-chip debug, or processor debug port control) has numerous benefits in the areas of test and debug, for Design Engineering, Manufacturing Test Engineering, and Field Service. What are they?

What is Board Bring-Up, and why does it take so long?

Board bring-up is a phased process whereby an electronics system, inclusive of assembly, hardware, firmware, and software elements, is successively tested, validated and debugged, iteratively, in order to achieve readiness for manufacture. This process can take so long that, sometimes, a product never gets to market because it is succeeded by the next generation.

The Coming Crisis in Board Bring-Up

I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?

Debugging CATERR and other failures

The challenge of system debug on Intel (and other) systems can be huge. What new tricks are available for debugging system hangs, crashes, or application errors?

Is your laptop highly available?

Maybe not yet, but…

I spent last weekend in gadget hell. First it was the garage door opener. Then my broadband home router started acting up. Finally I had to help my son with his laptop ‘blue screening’. I’m fed up and I’m not going to take it anymore…

Debugging on Steroids

ScanWorks Embedded Diagnostics is embedded firmware which uses a CPU’s debug port to access a system’s architecturally visible registers, memory and I/O. Acting as an “embedded JTAG-based debugger”, it can be operated remotely from anywhere and at anytime and troubleshoots the most difficult-to-debug hardware and software failures.

Intel x86 Design for Debug Guidelines

The ScanWorks Embedded Diagnostics solution for Intelâ x86 provides local and remote debugging capability via the CPU debug port instrument. Such capabilities include dumping of forensic data during a system crash or hang (i.e. register, memory and I/O), setting of breakpoints, and single-stepping through code.  ScanWorks Embedded Diagnostics thus acts as an embedded JTAG debugger, in-situ within an on-board service processor. It is thus hardware- and distance-independent and can be used anytime, anywhere in the world on numerous systems in parallel. This provides an extremely effective means of debugging BIOS, device driver, OS kernel, and intermittent or catastrophic hardware and software failures in the lab and in the field.

Rooting out impossible bugs

The use of effective embedded diagnostics to identify failures in today’s high-availability systems becomes more critical as semiconductor and board technologies increase in speed and integration. But many OEMs seem to be overlooking this vital aspect of their products’ post-sales operation, possibly due to their drive for shorter lead times and reduced costs. This myopia has lead to many news-worthy stories in recent times. But it wasn’t always like this…

No Trouble Found?

In my earlier blog on Debugging Watchdog Timeouts I mentioned the dreaded No Trouble Found (NTF) problem. Some have asked why NTF is important. Well, the answer is because NTF is a huge cost to companies, compounded by the fact that NTF is extremely difficult to quantify and to address. Something as simple as an errant wedding ring can cost companies millions of dollars. Let me explain…