The conventional approach to hardware-assisted debugging on Intel platforms involves physically connecting an external probe to the target. Is there a better way?
« November 2016 | Main | January 2017 »
December 2016
Dec 18, 2016
Dec 04, 2016
Using Embedded Run-Control for PCIe Link Testing – Part 2
In my last blog, I referred to the use of run-control technology to very quickly exercise the PCI Express link training state machine. What other kinds of tests can be run with this approach?
Continue reading "Using Embedded Run-Control for PCIe Link Testing – Part 2" »
ASSET on LinkedIn
ASSET on Facebook
@ASSETInterTechSearch
Categories
- Arium Probes | SourcePoint™
- Boundary Scan
- Embedded Diagnostics
- FPGA-based Fast Programming (FFP)
- FPGA-Controlled Test (FCT)
- High-Speed I/O
- IJTAG
- Industry Standards and Forums
- Intel® IBIST
- Non-intrusive Board Test (NBT)
- Processor-based Fast Programming (PFP)
- Processor-Controlled Test (PCT)
- Software Debug and Trace
- Software Debug and Trace - ARM
- Software Debug and Trace - Intel
