Tutorial | Board Test of DDR3|DDR4 Memory and Serial IO

Tutorial | Board Test of DDR3|DDR4 Memory and Serial IOFinally! The definitive reference on how circuit board and semiconductor defects and variances, in both the design and manufacturing processes, affect system quality and reliability. This is highly recommended reading for engineers and managers in Development and Production.

Download this tutorial to discover how the cumulative effect of defects and variances, particularly on DDR3 and DDR4 memories and high-speed serial IO, can contribute to system performance degradations, intermittent failures, and outright outages. 

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Alan Sguigna