Trace resources within chips allow for viewing of executing code and processor events. Intel processors support facilities such as Last Branch Record (LBR), Branch Trace Store (BTS), and Architecture Event Trace (AET). What are these?
Highly Accelerated Life Testing (HALT) and Highly
Accelerated Stress Screening (HASS) are often used to detect faults in
electronic systems, testing the extremes and determining the outer limits of
system margins. All hardware components and systems will eventually fail under
environmental stress. But can this technique be used to improve software
reliability as well?