Our chief technologist of non-intrusive board test, Adam
Ley, recently published an e-Book
on solving the problem of diminishing test coverage from In-Circuit Test (ICT).
What’s the key take-away from this publication?
Are you investing new capital on an old test strategy that is centered around in-circuit test but getting less of a return on that money? Much has changed in the decades since ICT was introduced. These changes are covered in Adam Ley's e-Book: Solving the Problems of Diminishing Test Coverage from In-Circuit Test (ICT). While test access and test coverage at ICT are diminishing, new standards and techniques continue to emerge to fill the void.
It’s all about time management in product development.
Nowhere is time management more critical than during board bring-up, when the
bare metal software needs to be integrated with the new hardware platform. The
problem is a chicken-or-egg issue. You need the hardware to develop the
software. To have functioning hardware, you need some bare-metal software. What
In a previous blog, I described how fixed and adaptive
equalization techniques are used within chips to ensure signal integrity even
in adverse system conditions. Why is it important to tune these parameters
within a chip?