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Many legacy In-Circuit Testers (ICT) support some kind of boundary scan for structural testing, to address limited access issues. But are these as good as advertised?
Continue reading "The Limitations of Boundary Scan on ICT" »
Posted by Alan Sguigna on May 28, 2012 in Boundary Scan, IJTAG, Industry Standards and Forums, Non-intrusive Board Test (NBT) | Permalink
In addition to board design/layout issues, manufacturing defects and variances, other factors such as pollution and power marginalities can affect a design’s signal integrity and subsequent performance.
Continue reading "Pollution, Power Margins, and SerDes Problems" »
Posted by Alan Sguigna on May 20, 2012 in High-Speed I/O, Industry Standards and Forums, Intel® IBIST | Permalink
Today’s flying probe testers can give high structural test coverage, making them ideal for prototype board bring-up and low-volume manufacturing. But they can be darned slow. Can boundary scan help?
Continue reading "Flying Probe Testers and Boundary Scan" »
Posted by Alan Sguigna on May 13, 2012 in Boundary Scan, Non-intrusive Board Test (NBT) | Permalink
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