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December 2011

Dec 05, 2011

The Coming Crisis in Board Bring-Up

I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?

Continue reading "The Coming Crisis in Board Bring-Up" »

Posted by Alan Sguigna on Dec 05, 2011 in Boundary Scan, Embedded Diagnostics, High-Speed I/O, IJTAG, IntelĀ® IBIST, Non-intrusive Board Test (NBT), Processor-Controlled Test (PCT) | Permalink | Comments (0)

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