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November 2011

Nov 06, 2011

Programming devices at In-Circuit Test?

I read a very interesting article recently making the case for programming PLDs and Flash Memory at In-Circuit Test (ICT). What do you think?

Continue reading "Programming devices at In-Circuit Test?" »

Posted by Alan Sguigna on Nov 06, 2011 in Processor-Controlled Test (PCT) | Permalink | Comments (0)

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