Test Data Out (TDO)

Drift in High-Speed I/O Circuits

With chip-to-chip interconnects now running at 8 GT/s and above, a new class of faults due to manufacturing and process drift is emerging. What are these faults and how are they detected?

IEEE P1687 and In-Circuit Test (ICT)

I read an interesting paper recently suggesting that IEEE 1687-based tests were best run at ICT on the manufacturing floor. The article was, of course, written by an ICT vendor. This is patently not true and is even a little bit preposterous. Let me explain…