I found an interesting article on the pros and cons of ICT recently at http://www.electroviews.com/test/in-circuit.php. The document is a little dated (it looks like it was written in 2007), so I thought I would capture the essence of what was listed in this paper and add in some comments as well:
Continue reading "More Problems with In-Circuit Test" »
Maybe not yet, but…
I spent last weekend in gadget hell. First it was the garage door opener. Then my broadband home router started acting up. Finally I had to help my son with his laptop ‘blue screening’. I’m fed up and I’m not going to take it anymore…
Continue reading "Is your laptop highly available?" »
Is that old bed-of-nails rather prickly these days?
Legacy In-Circuit Test (ICT) has been diminishing in value for a long time. Let’s explore some of the current technical issues with ICT as test access on new circuit board designs continues to disappear.
Continue reading "The Limitations of ICT" »
ScanWorks Embedded Diagnostics is embedded firmware which uses a CPU’s debug port to access a system’s architecturally visible registers, memory and I/O. Acting as an “embedded JTAG-based debugger”, it can be operated remotely from anywhere and at anytime and troubleshoots the most difficult-to-debug hardware and software failures.
Continue reading "Debugging on Steroids" »